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No image Direct Write E-Beam Lithography Systems
Since 1967, JEOL has produced Gaussian/Spot Electron Beam Lithography solutions. JEOL offers EBL products from 25kV to 200kV, with solutions such as an in-situ optical microscope to superior…
No image Gather-X Windowless EDS
Gather-X , a new Windowless EDS from JEOL, answers the need for higher sensitivity and low-energy X-Ray detection. The new 100mm 2 windowless EDS can collect the entire…
No image Soft X-ray Emission Spectrometer for EPMA and FE-SEM
JEOL has developed an unprecedented new type of wavelength dispersive spectrometer (WDS) that utilizes a variable space grating, allowing the efficient and parallel collection of very low energy-rays…